ISSDK  1.8
IoT Sensing Software Development Kit
Data Fields
fxls896x_selftest_t Struct Reference

This structure defines variables to compute self-test output change (STOC) and self-test offset (STOF). More...

Collaboration diagram for fxls896x_selftest_t:
Collaboration graph

Data Fields

int16_t x_stoc
 
int16_t y_stoc
 
int16_t z_stoc
 
int16_t x_stof
 
int16_t y_stof
 
int16_t z_stof
 
uint8_t complete_selftest
 

Detailed Description

This structure defines variables to compute self-test output change (STOC) and self-test offset (STOF).

Definition at line 194 of file fxls8962_freemaster_demo.c.

Field Documentation

◆ complete_selftest

uint8_t complete_selftest

Definition at line 202 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().

◆ x_stoc

int16_t x_stoc

Definition at line 196 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().

◆ x_stof

int16_t x_stof

Definition at line 199 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().

◆ y_stoc

int16_t y_stoc

Definition at line 197 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().

◆ y_stof

int16_t y_stof

Definition at line 200 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().

◆ z_stoc

int16_t z_stoc

Definition at line 198 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().

◆ z_stof

int16_t z_stof

Definition at line 201 of file fxls8962_freemaster_demo.c.

Referenced by perform_selftest(), and selftest_init().


The documentation for this struct was generated from the following files: