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25.06.00-pvw1
MCUXpresso SDK Project v: latest
Document Release Versions
24.12.00-pvw2
24.12.00
25.03.00-pvw2
25.03.00
latest

Introduction

  • MCUXpresso SDK
  • Setup

Getting Started

  • Github Repository
  • Zip Package

User Guide

  • Drivers
  • Examples
  • Middlewares
    • Boot
    • Cloud
    • Connectivity
    • eIQ
    • File System
    • Motor Control
    • MultiCore
    • Multimedia
      • Audio Voice
        • Audio Voice Components
          • Audio Voice Components
          • Overview
          • Content
          • AAC decoder
          • API Usage of AAC Decoder
          • FLAC decoder
          • API Usage of FLAC Decoder
          • MP3 decoder
          • API Usage of MP3 Decoder
          • WAV decoder
          • API Usage of WAV Decoder
          • Synchronous Sample Rate Converter
        • Maestro Audio Framework
      • LVGL Graphics Library
      • VGLite Graphics Driver
      • Xtensa Audio Framework (XAF)
    • Wireless
    • Sensors
  • RTOS
  • Boards

Development

  • Architecture
  • Build And Configuration System
  • Developing with MCUXpresso SDK

Releases

  • Release Notes
mcuxsdk
  • Docs / 25.06.00-pvw1 »
  • Middleware »
  • Audio Voice »
  • Audio Voice Components »
  • Synchronous Sample Rate Converter
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Synchronous Sample Rate Converter

Table of Contents

  • Introduction
    • Acronyms
    • Performance figures
    • Resource usage
      • Memory requirements
      • Processing requirements
        • On Arm7 and Arm9
        • On Arm9e and XScale
        • On Cortex-A8 for worst case of 48000 Hz to 44100 Hz
  • Application programmers interface (API)
    • Type definitions
      • Types for allocation of instance and scratch memory
      • LVM_Fs_en
      • LVM_Format_en
      • SSRC_Quality_en
      • Instance parameters
      • Nr of samples mode
      • Function return status
    • Functions
      • SSRC_GetNrSamples
      • SSRC_GetScratchSize
      • SSRC_Init
      • SSRC_SetGains
      • SSRC_Process
      • SSRC_Process_D32
    • Dynamic function usage
      • Define the number of samples to be used on input and output
      • Allocate scratch memory
      • Initialize the SSRC instance
      • Process samples
      • Destroy the SSRC instance
    • Reentrancy
  • Additional user information
    • Attenuation of the signal
    • Notes on integration
  • Example application
  • Integration test
    • Bit accurate test
    • THD+N measurement

Copyright 2025, NXP. Last generated on Apr 23, 2025 13:43+0200; branch release/25.06.00-pvw1, revision 37f4823f37be0be386f37b97e43a105ab02ecab1.